An electronic device used to polymerize a sealant and a composite resin has been found to emit 365-nanometer radiation at levels sufficient to kill the bacterium Escherichia coli rapidly (greater than 14,000 ergs per square millimeter per second). Because of the absence of shielding on the probe, significant amounts of energy (up to 45% of that at the probe tip) were measured at the sides of the probe. These findings--supported by the well-documented findings of biological damage caused by near-ultraviolet radiation, including skin cancer, damage to the lens of the eye, and mutagenic effects--suggest that clinicians take appropriate precautions to avoid potential hazards to themselves and their patients.

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				R. Webb and M. Brown Genetic damage in Escherichia coli K12 AB2480 by broad-spectrum near-ultraviolet radiation Science, February 19, 1982; 215(4535): 991 - 993. [PDF]